IC test system ICI 03 L-EFT set
Testing security-critical circuits with three different types of ICI sources.
The ICI 03 L-EFT set is a different set of three types of ICI sources: pulse magnetic field source, pulse electric field source, and pulse current source (FBBI). It enables very high precision and high-resolution IC analysis, and also allows for side-channel analysis, making it possible to test circuits that are critical for security. The features of the ICI 03 L-ET set include a probe tip with very high resolution (capable of testing very small areas) and a very low trigger for pulse jitter (destruction at specific points in the program sequence).
